Atomic Force Microscope (AFM)
Horiba SmartSPM AIST
- High speed 100µm scanner
- 1300nm AFM laser
- Lowest noise closed loop sensors
Operating Modes:
- Contact and Non-contact AFM mode in air/liquid
- Conductive AFM
- Kelvin Probe (Surface Potential Microscopy)
- Nanolithography
Graphene Oxide on gold coated substrate
Nano spirals, Tiago Ramos Leite da Silva, ChE LSU
Carbon Nanowires on gold substrate
Veeco Dimension 3100
The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Samples can be handled by the instrument range from small pieces to 150 mm diameter wafers.
Modes: Contact and Tapping mode
Pristine poly(styrene-block-methyl methacrylate) film by Qi Lei, ChE LSU
Template stripped Silver film by Tiago Ramos Leite da Silva, ChE LSU